Dear colleagues, I would like to let you know that a new SPARTA paper have been accepted to the Microelectronics Reliability journal. It acknowledges the support of SPARTA. With my best regards, Jean-Max J.-M. Dutertre, A. Menu, O. Potin, J.-B. Rigaud, and J.-L. Danger Experimental analysis of the electromagnetic instruction skip fault model and consequences for software countermeasures Microelectronics Reliability, 121, 2021. https://doi.org/10.1016/j.microrel.2021.114133 <https://doi.org/10.1016/j.microrel.2021.114133> Also available in open access from 2021-12-01. https://hal.archives-ouvertes.fr/hal-03360628/ <https://hal.archives-ouvertes.fr/hal-03360628/> And in SPARTA SVN: https://sparta.technikon.com/03-WPs/WP6-Program-3-HAII-T/Management/Publica… <https://sparta.technikon.com/03-WPs/WP6-Program-3-HAII-T/Management/Publications/hal_2021_EM_fault_model_Micro_Reliability_authors_version_JMDutertre_IMT.pdf> -------------------------------------------------------------- Jean-Max Dutertre Responsable département SAS Professeur Département Systèmes et Architectures Sécurisés - SAS Ecole Nationale Supérieure des Mines de Saint-Etienne Centre Microélectronique de Provence - Campus Georges Charpak Provence 880, av. de Mimet 13541 Gardanne Bureau A.2.23 Tel : +33 (0)4 42 61 67 36 Fax : +33 (0)4 42 61 65 92 E-mail: dutertre(a)emse.fr <mailto:dutertre@emse.fr> Web : www.emse.fr/~dutertre <http://www.emse.fr/~dutertre> --------------------------------------------------------------