Dear colleagues,

I would like to let you know that a new SPARTA paper have been accepted to the Microelectronics Reliability journal.
It acknowledges the support of SPARTA.

With my best regards,
Jean-Max


J.-M. Dutertre, A. Menu, O. Potin, J.-B. Rigaud, and J.-L. Danger
Experimental analysis of the electromagnetic instruction skip fault model and consequences for software countermeasures
Microelectronics Reliability, 121, 2021.
https://doi.org/10.1016/j.microrel.2021.114133

Also available in open access from 2021-12-01.
https://hal.archives-ouvertes.fr/hal-03360628/

And in SPARTA SVN: https://sparta.technikon.com/03-WPs/WP6-Program-3-HAII-T/Management/Publications/hal_2021_EM_fault_model_Micro_Reliability_authors_version_JMDutertre_IMT.pdf 
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Jean-Max Dutertre
Responsable département SAS
Professeur
Département Systèmes et Architectures Sécurisés - SAS
Ecole Nationale Supérieure des Mines de Saint-Etienne
Centre Microélectronique de Provence - Campus Georges Charpak Provence
880, av. de Mimet
13541 Gardanne
 
Bureau A.2.23
Tel : +33 (0)4 42 61 67 36
Fax : +33 (0)4 42 61 65 92
E-mail: dutertre@emse.fr
Web : www.emse.fr/~dutertre
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