Dear colleagues,
I would like to let you know that we submitted a new SPARTA paper to the Microelectronics
Reliability journal (
https://www.journals.elsevier.com/microelectronics-reliability
<https://www.journals.elsevier.com/microelectronics-reliability>).
It acknowledges the support of SPARTA. It extends from laser to EM perturbations the
results of our previous SPARTA papers accepted at NordSec2019 and DTIS 2020.
Please find attached the submitted paper.
With my best regards,
Jean-Max
Title: Experimental Analysis of the Electromagnetic Instruction Skip Fault Model and
Consequences for Software Countermeasures
Authors: Menu, Alexandre and Dutertre, Jean-Max and Potin, Olivier and Rigaud,
Jean-Baptiste and Danger, Jean-Luc
Journal: Microelectronics Reliability journal
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Jean-Max Dutertre
Responsable département SAS
Professeur
Département Systèmes et Architectures Sécurisés - SAS
Ecole Nationale Supérieure des Mines de Saint-Etienne
Centre Microélectronique de Provence - Campus Georges Charpak Provence
880, av. de Mimet
13541 Gardanne
Bureau A.2.23
Tel : +33 (0)4 42 61 67 36
Fax : +33 (0)4 42 61 65 92
E-mail: dutertre(a)emse.fr <mailto:dutertre@emse.fr>
Web :
www.emse.fr/~dutertre <http://www.emse.fr/~dutertre>
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