It acknowledges the support of SPARTA. It extends from laser to EM perturbations the results of our previous SPARTA papers accepted at NordSec2019 and DTIS 2020.
Please find attached the submitted paper.
Authors: Menu, Alexandre and Dutertre, Jean-Max and Potin, Olivier and Rigaud, Jean-Baptiste and Danger, Jean-Luc
Journal: Microelectronics Reliability journal