Dear colleagues,

I would like to let you know that we submitted a new SPARTA paper to the Microelectronics Reliability journal (https://www.journals.elsevier.com/microelectronics-reliability).
It acknowledges the support of SPARTA. It extends from laser to EM perturbations the results of our previous SPARTA papers accepted at NordSec2019 and DTIS 2020.
Please find attached the submitted paper.

With my best regards,
Jean-Max

Title: Experimental Analysis of the Electromagnetic Instruction Skip Fault Model and Consequences for Software Countermeasures
Authors: Menu, Alexandre and Dutertre, Jean-Max and Potin, Olivier and Rigaud, Jean-Baptiste and Danger, Jean-Luc
JournalMicroelectronics Reliability journal